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Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /

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Bibliographic Details
Corporate Author: International Conference on Secondary Ion Mass Spectrometry Stanford University
Other Authors: Benninghoven, A.
Format: Conference Proceeding Book
Language:English
Published: New York : Springer-Verlag, 1979.
Series:Springer series in chemical physics ; v. 9.
Subjects:
Mass spectrometry > Congresses.
Description
Physical Description:xiii, 298 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.