Contamination control in trace element analysis /

Bibliographic Details
Main Author:	Zief, Morris
Other Authors:	Mitchell, James W.
Format:	Book
Language:	English
Published:	New York : Wiley, [1976]
Series:	Chemical analysis ; v. 47.
Subjects:	Trace elements > Analysis. Contamination (Technology)

Description
Item Description:	"A Wiley-Interscience publication."
Physical Description:	xiv, 262 pages : illustrations ; 24 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0471611697