Chemical analysis via heavy ion induced x-ray emission /
| Main Author: | |
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| Other Authors: | , , |
| Format: | Thesis Book |
| Language: | English |
| Published: |
[College Station, Tex.] :
Cross,
1976.
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| Subjects: | |
| Online Access: | Link to OAKTrust copy Link to ProQuest copy |
| Abstract: | Characteristic x-ray and background radiation production trends for high energy heavy ion bombardment on a wide range of targets (14 < Z < 74) were investigated. The ion beams used include: 1.65, 2.6 and 7 McV protons, 1.65 MeV/amu alphas, 0.5, 1.0, 2.06, 3.38 and 7.06 MeV/amu O(superscript n⁺) 0.98 and 2.0 MeV/amu Ar(superscript n⁺), 0.52 and 1.03 MeV/amu Cu(superscript n⁺), 0.49, 0.68 and 0.99 MeV/amu Kr(superscript n⁺), and 0.44 MeV/amu Xe⁷⁺. A method for optimizing the projectile size and energy to achieve maximum measurement sensitivity has been devised based upon an observed enhancement in x-ray production when (a) the projectile energy is increased or (b) the K or L shell binding energy of the projectile approximately matches the K or L shell binding energy of the target atom. A comparison of the capabilities offered by different beams, including excitation with 1.65 MeV protons, for the simultaneous detection of trace elements in thick targets has been made. Oxygen ion bombardment was found to provide a simultaneous multi-element capability for trace elements at levels as low as 10⁻¹⁰ g in a total sample assayed of ~10⁻⁴ g. These data were obtained with a 7.06 MeV/amu 0⁴⁺ beam of 40 nA 13 and 1000 sec bombarding time (6.3 x 10¹³ particles).. |
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| Item Description: | Vita. "Major subject: Chemistry." |
| Physical Description: | xv, 119 leaves : illustrations, graphs, tables ; 28 cm |
| Bibliography: | Includes bibliographical references (leaves 110-113). |