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Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Bibliographic Details
Corporate Authors: International Test Conference Washington, D.C., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : IEEE Computer Society Press, [1986]
Subjects:
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.
Description
Item Description:Spine title: IEEE Test Conference.
"IEEE catalog number 86CH2339-0."
Physical Description:xxx, 1009 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:0818607262 (pbk.)
0818647264 (microfiche)
0818687266 (hard)