APA (7th ed.) Citation

International Test Conference Washington, D.C., IEEE Computer Society, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1986). Testing's impact on design & technology: International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986. IEEE Computer Society Press.

Chicago Style (17th ed.) Citation

International Test Conference Washington, D.C., IEEE Computer Society, and Institute of Electrical and Electronics Engineers. Philadelphia Section. Testing's Impact on Design & Technology: International Test Conference, 1986, Proceedings, September 8, 9, 10, 11, 1986. Washington, D.C.: IEEE Computer Society Press, 1986.

MLA (9th ed.) Citation

International Test Conference Washington, D.C., et al. Testing's Impact on Design & Technology: International Test Conference, 1986, Proceedings, September 8, 9, 10, 11, 1986. IEEE Computer Society Press, 1986.