Reliability and degradation : semiconductor devices and circuits /
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Chichester ; New York :
J. Wiley,
[1981]
|
| Series: | Wiley series in solid state devices and circuits.
|
| Subjects: |
| Item Description: | Includes bibliographical references and index. "A Wiley-Interscience publication." |
|---|---|
| Physical Description: | xii, 444 pages : illustrations ; 24 cm. |
| ISBN: | 0471280283 |