APA (7th ed.) Citation

Howes, M. J., & Morgan, D. V. (1981). Reliability and degradation: Semiconductor devices and circuits. J. Wiley.

Chicago Style (17th ed.) Citation

Howes, M. J., and D. V. Morgan. Reliability and Degradation: Semiconductor Devices and Circuits. Chichester ; New York: J. Wiley, 1981.

MLA (9th ed.) Citation

Howes, M. J., and D. V. Morgan. Reliability and Degradation: Semiconductor Devices and Circuits. J. Wiley, 1981.