rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Secondary ion mass spectrometry
    sub title: SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985
  name:
    name part: International Conference on Secondary Ion Mass Spectrometry 1985 : Washington, D.C.)
    role:
      role term: creator
  name:
    name part: Benninghoven, A.
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: wb
    date issued: 1986
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xxi, 561 pages : illustrations ; 24 cm.
  note: editors, A. Benninghoven [and others].
  note: Includes bibliographies and index.
  subject:
    topic: Secondary ion mass spectrometry
    topic: Congresses
  classification: QD96.S43 I58 1985
  classification: 539/.6/028
  related item:
    title info:
      title: Springer series in chemical physics ; v. 44
  identifier: 0387162631 (U.S.)
  identifier: 86003921
  record info:
    record content source: DLC
    record creation date: 860303
    record change date: 20151012064248.0
    record identifier: in00000432153