Optical testing and metrology : 3-6 June 1986, Quebec City, Canada /
| Corporate Authors: | , , |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
[1986]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 661. |
| Subjects: |
| Physical Description: | viii, 428 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0892526963 (pbk.) |