Recent development of electron microscopy : proceedings of the Second Chinese-Japanese Electron Microscopy Seminar held in Beijing from October 17 to October 19 in 1983 /
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| Format: | Conference Proceeding Book |
| Language: | English |
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Tokyo, Japan :
Business Center for Academic Societies Japan,
1985.
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| Physical Description: | 279 pages : illustrations, group portrait ; 22 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 4930813115 |