Scanning electron microscopy : physics of image formation and microanalysis /

Bibliographic Details
Main Author: Reimer, Ludwig, 1928-
Format: Book
Language:English
Published: Berlin ; New York : Springer-Verlag, [1985]
Series:Springer series in optical sciences ; v. 45.
Subjects:
Description
Item Description:Includes index.
Physical Description:xviii, 457 pages : illustrations ; 24 cm.
Bibliography:Bibliography: pages [405]-446.
ISBN:0387135308 (U.S.)