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The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

Bibliographic Details
Corporate Authors:	International Test Conference Philadelphia, Pa., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, [1985]
Subjects:	Integrated circuits > Testing > Congresses. Semiconductors > Testing > Congresses.

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