Cover Image

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

Bibliographic Details
Corporate Authors: International Test Conference Philadelphia, Pa., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : Los Angeles, CA : IEEE Computer Society Press ; Order from IEEE Computer Society, [1985]
Subjects:
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.
Description
Item Description:"IEEE catalog number 85CH2230-1."
"Computer Society order number 641."
Physical Description:xxx, 988 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:081860641X (pbk.)
0818646411 (microfiche)