APA (7th ed.) Citation

International Test Conference Philadelphia, Pa., IEEE Computer Society, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1985). The future of test: International Test Conference, 1985 proceedings, November 19, 20, 21, 1985. IEEE Computer Society Press ; Order from IEEE Computer Society.

Chicago Style (17th ed.) Citation

International Test Conference Philadelphia, Pa., IEEE Computer Society, and Institute of Electrical and Electronics Engineers. Philadelphia Section. The Future of Test: International Test Conference, 1985 Proceedings, November 19, 20, 21, 1985. Washington, D.C. : Los Angeles, CA: IEEE Computer Society Press ; Order from IEEE Computer Society, 1985.

MLA (9th ed.) Citation

International Test Conference Philadelphia, Pa., et al. The Future of Test: International Test Conference, 1985 Proceedings, November 19, 20, 21, 1985. IEEE Computer Society Press ; Order from IEEE Computer Society, 1985.