Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California /

Bibliographic Details
Corporate Author:	Sira Limited
Other Authors:	Baker, L. R. (Lionel R.), Bennett, Harold Earl, 1929-
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE--the International Society for Optical Engineering, [1985]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 525.
Subjects:	Optical instruments > Surfaces > Congresses. Surfaces (Technology) > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0525.toc

Description
Physical Description:	vi, 198 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographies and index.
ISBN:	0892525606 (pbk.)