Cover Image

Symposium on Anomalies, Geometry, Topology /

Bibliographic Details
Corporate Authors: Symposium on Anomalies, Geometry, Topology Chicago, Ill., Argonne National Laboratory, Fermi National Accelerator Laboratory, University of Chicago
Other Authors: Bardeen, William A., White, Alan R.
Format: Conference Proceeding Book
Language:English
Published: Singapore : World Scientific, 1985.
Subjects:
Geometry > Congresses.
Topology > Congresses.
Gauge fields (Physics) > Congresses.
Superstring theories > Congresses.
Description
Physical Description:xviii, 558 pages ; 23 cm.
Bibliography:Includes bibliographies.
ISBN:9971978695
9971978725 (pbk.)