Cover Image

ATFA-78 : advanced techniques in failure analysis, 6-9 November 1978, Airport Marriott Hotel, Los Angeles, California USA : proceedings /

Bibliographic Details
Corporate Authors: Institute of Electrical and Electronics Engineers, Institute of Electrical and Electronics Engineers. Los Angeles Council
Format: Book
Language:English
Published: New York, N.Y. : IEEE, [1978]
Subjects:
Electronic apparatus and appliances > Testing > Congresses.
Semiconductors > Testing > Congresses.
Description
Item Description:Cover title.
"IEEE catalog number 78CH1407-6 Reg. 6. ."
Physical Description:vii, 200 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.