Energy dispersion X-ray analysis: X-ray and electron probe analysis /

Bibliographic Details
Corporate Authors: Symposium on Energy Dispersion X-ray Analysis: X-ray and Electron Probe Analysis Toronto, American Society for Testing and Materials. Committee E-4 on Metallography
Format: Conference Proceeding Book
Language:English
Published: Philadelphia : American Society for Testing and Materials, [1971]
Series:ASTM special technical publication ; 485.
Subjects:
Description
Item Description:"A symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."
Sponsored by the ASTM Committee E-4 on Metallography.
Physical Description:285 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references.
ISBN:0803100701