Defect analysis in electron microscopy /

Bibliographic Details
Main Author:	Loretto, M. H.
Other Authors:	Smallman, R. E.
Format:	Book
Language:	English
Published:	London : Chapman and Hall ; [1975]
Subjects:	Crystals > Defects. Electron microscopy.

Description
Item Description:	"A Halsted Press book." Includes index.
Physical Description:	ix, 134 pages : illustrations ; 24 cm.
Bibliography:	Bibliography: page 131.
ISBN:	0412137704 (pbk.)