Cover Image

Memory & LSI : digest of papers /

Bibliographic Details
Corporate Authors: Semiconductor Test Symposium Cherry Hill, N.J., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; Available from IEEE Computer Society Publications Office, [1977]
Subjects:
Integrated circuits > Testing > Congresses.
Integrated circuits > Large scale integration > Congresses.
Semiconductor storage devices > Testing.
Microprocessors > Testing > Congresses.
Description
Item Description:"77CH 1261-7C."
Physical Description:x, 198 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.