Cover Image

Speckle metrology /

Show other versions (1)
Bibliographic Details
Other Authors: Erf, Robert K.
Format: Book
Language:English
Published: New York : Academic Press, [1978]
Series:Quantum electronics--principles and applications.
Subjects:
Speckle metrology.
Search Result 1
Cover Image
Published 1978
Connect to the full text of this electronic book
eBook
Show all versions (2)