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Speckle metrology /

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Bibliographic Details
Other Authors: Erf, Robert K.
Format: Book
Language:English
Published: New York : Academic Press, [1978]
Series:Quantum electronics--principles and applications.
Subjects:
Speckle metrology.
Description
Physical Description:xiv, 331 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0122413601