Terman, L. M., & Merrill, M. A. (1937). Measuring intelligence: A guide to the administration of the new revised Stanford-Binet tests of intelligence. Houghton Mifflin company.
Chicago Style (17th ed.) CitationTerman, Lewis M., and Maud A. Merrill. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Boston, New York [etc.]: Houghton Mifflin company, 1937.
MLA (9th ed.) CitationTerman, Lewis M., and Maud A. Merrill. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Houghton Mifflin company, 1937.
Warning: These citations may not always be 100% accurate.