Methods of radar cross-section analysis /

Bibliographic Details
Main Author: Crispin, J. W. (John W.)
Corporate Author: Conductron Corporation
Other Authors: Siegel, K. M. (Keeve Milton), 1923-, Bowman, J. J.
Format: Book
Language:English
Published: New York : Academic Press, 1968.
Series:Electrical science series.
Subjects:

MARC

Tag First Indicator Second Indicator Subfields
LEADER 00000cam a22000001 4500
001 in00000097931
005 20150925115256.0
008 700928s1968 nyua b 00010 eng
010 |a  68018663  
035 |a (OCoLC)00440556 
035 |9 AAL3126AM 
040 |a DLC  |c DLC  |d TXA  |d UtOrBLW 
049 |a TXAM  |c [526290] 
050 0 0 |a TK6580  |b .C74 1968 
082 0 |a 621.3848/1 
100 1 |a Crispin, J. W.  |q (John W.) 
245 1 0 |a Methods of radar cross-section analysis /  |c by members of the staff of the Conductron Corporation: J. J. Bowman [and others] edited by J. W. Crispin, Jr., and K. M. Siegel. 
264 1 |a New York :  |b Academic Press,  |c 1968. 
300 |a xiv, 426 pages :  |b illustrations ;  |c 24 cm. 
336 |a text  |b txt  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
490 1 |a Electrical science 
504 |a Includes bibliographies. 
650 0 |a Radar. 
700 1 |a Siegel, K. M.  |q (Keeve Milton),  |d 1923- 
700 1 |a Bowman, J. J. 
710 2 |a Conductron Corporation. 
830 0 |a Electrical science series. 
999 |a MARS 
999 f f |s e2fdef0d-2ced-30b7-bbff-ee3c3f621525  |i 318182b5-405e-3678-b5ed-73453aa73ce3  |t 0 
952 f f |p ric  |a Texas A&M University  |b Rellis Campus  |c Joint Library Facility  |d Remote Storage  |t 0  |e TK6580 .C74 1968  |h Library of Congress classification  |i unmediated -- volume  |m A14805489989 
998 f f |a TK6580 .C74 1968  |t 0  |l Remote Storage