Pattern recognition studies, seminar-in-depth ; proceedings.

Bibliographic Details
Corporate Author: Pattern Recognition Society
Format: Book
Language:English
Published: [Redondo Beach, Calif.] : Society of Photo-optical Instrumentation Engineers, [1969]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 18.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0018.toc

MARC

Tag First Indicator Second Indicator Subfields
LEADER 00000cam a2200000 4500
001 in00000096347
005 20230320170746.0
008 710913s1969 cauac b 100 0 eng
010 |a  77028175  
035 |a (OCoLC)00200123 
035 |9 AAL2315AM 
040 |a DLC  |c DLC  |d TXA  |d UtOrBLW 
049 |a TXAM  |c [1028027] 
050 0 0 |a TK7882.O6  |b P3 
082 0 |a 621.38/0414 
245 0 0 |a Pattern recognition studies, seminar-in-depth ;  |b proceedings. 
264 1 |a [Redondo Beach, Calif.] :  |b Society of Photo-optical Instrumentation Engineers,  |c [1969] 
264 4 |c ©1969 
300 |a viii, 225 pages :  |b illustrations, portraits ;  |c 28 cm. 
336 |a text  |b txt  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
490 1 |a S.P.I.E. seminar proceedings v. 18 
500 |a Papers presented at a seminar held June 9-10, 1969 in New York, co-sponsored by Pattern Recognition Society. 
504 |a Includes bibliographies. 
650 0 |a Optical pattern recognition  |v Congresses. 
710 2 |a Pattern Recognition Society. 
830 0 |a Proceedings of SPIE--the International Society for Optical Engineering ;  |v v. 18. 
856 4 1 |u https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0018.toc  |t 0 
999 |a MARS 
999 f f |s 33ac52ed-c70b-3e6e-a27d-38f1e4436f64  |i e32a8655-1dcd-3a9f-8e5a-78d77323908a  |t 0 
952 f f |p ric  |a Texas A&M University  |b Rellis Campus  |c Joint Library Facility  |d Remote Storage  |t 0  |e TK7882.O6 P3  |h Library of Congress classification  |i unmediated -- volume  |m A14805510594 
998 f f |a TK7882.O6 P3  |t 0  |l Remote Storage