| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000cam a2200000 4500 |
| 001 |
in00000093828 |
| 005 |
20150927070223.0 |
| 008 |
700804s1970 enka b 00110 eng |
| 010 |
|
|
|a 78109034
|
| 015 |
|
|
|a B***
|
| 020 |
|
|
|a 0126926506
|
| 035 |
|
|
|a (OCoLC)00089095
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| 035 |
|
|
|9 AAL5678AM
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| 040 |
|
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|a DLC
|c DLC
|d TXA
|d UtOrBLW
|
| 049 |
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|
|a TXAM
|c [533950]
|
| 050 |
0 |
0 |
|a TN690
|b .T56
|
| 082 |
0 |
|
|a 669.9/5/0282
|
| 100 |
1 |
|
|a Tolansky, S.
|q (Samuel),
|d 1907-1973.
|
| 245 |
1 |
0 |
|a Multiple-beam interference microscopy of metals /
|c by S. Tolansky.
|
| 264 |
|
1 |
|a London,
|a New York :
|b Academic Press,
|c 1970.
|
| 300 |
|
|
|a ix, 147 pages :
|b illustrations ;
|c 24 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 504 |
|
|
|a Includes bibliographical references.
|
| 650 |
|
0 |
|a Interference microscopes.
|
| 650 |
|
0 |
|a Metallography.
|
| 999 |
|
|
|a MARS
|
| 999 |
f |
f |
|s 3df4fd8f-3ff9-3638-8b22-cfef03d79b21
|i b931d951-ea5c-3347-8020-17c1bbeab19f
|t 0
|
| 952 |
f |
f |
|p ric
|a Texas A&M University
|b Rellis Campus
|c Joint Library Facility
|d Remote Storage
|t 0
|e TN690 .T56
|h Library of Congress classification
|i unmediated -- volume
|m A14805581317
|
| 998 |
f |
f |
|a TN690 .T56
|t 0
|l Remote Storage
|