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Proceedings of the 1992 International Symposium on Microelectronics : October 19-21, 1992, Moscone Center, San Fransisco, California /
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Proceedings of the 1988 International Symposium on Microelectronics : October 17-19 1988, Washington State Convention and Trade Center, Seattle, Washington /
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Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October 1997, Austin, Texas /
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Proceedings of the 1990 International Symposium on Microelectronics, October 15-17, 1990, McCormick Place North, Chicago, Illinois /
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In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland /
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Silicon Run II /
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