Yield of electronic materials and devices.

Bibliographic Details
Corporate Author: National Research Council (U.S.). Ad Hoc Panel on Yield of Electronic Materials and Devices
Format: Book
Language:English
Published: Washington : National Academy of Sciences, 1972.
Subjects:
Description
Physical Description:xiv, 82 pages : illustrations ; 23 cm.
Bibliography:Includes bibliographies.
ISBN:0309021081