Instabilities in MOS devices /

Ionizing radiation effects in MOS devices and circuits /
Published: (1989)

Hot carrier design considerations for MOS devices and circuits /
Published: (1992)

Fundamentals of bias temperature instability in MOS transistors : characterization methods, process and materials impact, DC and AC modeling /
Published: (2016)

Modern MOS technology : processes, devices, and design /
by: Ong, DeWitt G.
Published: (1984)

MOS devices for low-voltage and low-energy applications /
by: Omura, Y. (Yasuhisa), et al.
Published: (2017)

The MOS system /
by: Engström, Olof
Published: (2014)

Operation and modeling of the MOS transistor /
by: Tsividis, Yannis
Published: (1999)

Operation and modeling of the MOS transistor /
by: Tsividis, Yannis
Published: (2011)

MOS (metal oxide semiconductor) physics and technology /
by: Nicollian, E. H.
Published: (1982)

MOS (metal oxide semiconductor) physics and technology /
by: Nicollian, E. H.
Published: (2003)

Design of bipolar and MOS-circuits /
by: McCreary, J.
Published: (1983)

Ionizing radiation effects in MOS oxides /
by: Oldham, Timothy R., 1947-
Published: (1999)

Charge-based MOS transistor modeling : the EKV model for low-power and RF IC design /
by: Enz, Christian
Published: (2006)

Charge-based MOS transistor modeling : the EKV model for low-power and RF IC design /
by: Enz, Christian
Published: (2006)

Advanced MOS devices and their circuit applications /
Published: (2024)

The MOS memory data book, 1982 /
Published: (1982)

The MOS memory data book for design engineers /
Published: (1979)

Matching properties of deep sub-micron MOS transistors /
by: Croon, Jeroen A.
Published: (2005)

Rare-earth implanted MOS devices for silicon photonics : microstructural, electrical and optoelectronic properties /
Published: (2010)

Advanced MOS devices and their circuit applications /
Published: (2024)

MOS digital electronics /
by: Cheng, Stephen Shao-chung
Published: (1987)

MOS field-effect transistors and integrated circuits.
by: Richman, Paul
Published: (1973)

Systematic analysis of bipolar and MOS transistors /
by: Çilingiroğlu, Uğur
Published: (1993)

Wafer level reliability of advanced CMOS devices and processes /
Published: (2008)

Low-frequency noise in advanced MOS devices /
by: Von Haartman, Martin
Published: (2007)

Electronic device architectures for the nano-CMOS era : from ultimate CMOS scaling to beyond CMOS devices /
Published: (2009)

Carrier transport in nanoscale MOS transistors /
by: Tsuchiya, Hideaki
Published: (2016)

Metal oxide semiconductors : synthesis, properties, and devices /
by: Zang, Zhigang, et al.
Published: (2024)

Nanostructured semiconductor oxides for the next generation of electronics and functional devices : properties and applications /
by: Zhuiykov, Serge
Published: (2014)

Materials and devices for "beyond CMOS" scaling : March 24-28, 2008, San Francisco, California, USA.
Published: (2008)

Semiconductor devices /
by: Kano, Kanaan
Published: (1998)

Latchup in CMOS technology : the problem and its cure /
by: Troutman, Ronald R.
Published: (1986)

Energy-efficient devices and circuits for neuromorphic computing /
Published: (2025)

Transient-induced latchup in CMOS integrated circuits /
by: Ker, Ming-Dou
Published: (2009)

Transient-induced latchup in CMOS integrated circuits /
by: Ker, Ming-Dou
Published: (2009)

Model and design of bipolar and MOS current-mode logic : CML, ECL and SCL digital circuits /
by: Alioto, Massimo
Published: (2005)