Introduction to digital board testing /

Developments in integrated circuit testing /
Published: (1987)

Digital circuit testing : a guide to DFT and other techniques /
by: Wang, Francis C.
Published: (1991)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
by: Bushnell, Michael L. (Michael Lee), 1950-
Published: (2000)

Automatic testing and evaluation of digital integrated circuits /
by: Healy, James T., 1940-
Published: (1981)

Fault diagnosis of digital circuits /
by: I︠A︡rmolik, V. N. (Vi︠a︡cheslav Nikolaevich)
Published: (1990)

Digital integrated circuits : design-for-test using Simulink and Stateflow /
by: Perelroyzen, Evgeni
Published: (2007)

Testability concepts for digital ICs : the macro test approach /
by: Beenker, F. P. M. (Frans P. M.)
Published: (1995)

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Published: (1983)

New frontiers in testing : International Test Conference, 1988, proceedings : September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC /
Published: (1988)

Thermal-aware testing of digital VLSI circuits and systems /
by: Chattopadhyay, Santanu
Published: (2018)

An introduction to mixed-signal IC test and measurement /
by: Burns, Mark, 1962-
Published: (2001)

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /
Published: (1981)

Meeting the tests of time : International Test Conference, 1989 proceedings, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC /
Published: (1989)

The three faces of test : design, characterization, production : proceedings /
Published: (1984)

Proceedings : International Test Conference 1991, [October 26-30, 1991, Opryland Hotel, Nashville, TN] /
Published: (1991)

A unified approach for timing verification and delay fault testing /
by: Sivaraman, Mukund, 1970-
Published: (1998)

Digital integrated circuits : design-for-test using Simulink and Stateflow /
by: Perelroyzen, Evgeni
Published: (2007)

CTL for test information of digital ICs /
by: Kapur, Rohit
Published: (2003)

High-level test synthesis of digital VLSI circuits /
by: Lee, Mike Tien-Chien
Published: (1997)

Proceedings : International Test Conference 1994.
Published: (1994)

Proceedings : International Test Conference 1997.
Published: (1997)

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
by: Bahukudumbi, Sudarshan
Published: (2010)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
Published: (2008)

Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits /
by: Bushnell, Michael L. (Michael Lee), 1950-
Published: (2002)

Assessing fault model and test quality /
by: Butler, Kenneth M., 1962-
Published: (1992)

Analog and mixed-signal test /
Published: (1998)

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /
Published: (1979)

Proceedings : International Test Conference 1996.
Published: (1996)

Proceedings International Test Conference 2002 /
Published: (2002)

Introduction to VLSI testing /
by: Feugate, Robert J., 1946-
Published: (1988)

Introduction to ID̳D̳Q̳ testing /
by: Chakravarty, Sreejit
Published: (1997)

Proceedings of the 1st European Test Conference : Paris, April 12-14, 1989.
Published: (1989)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
Published: (2008)

Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA /
Published: (2003)

Principles of semiconductor network testing /
by: Afshar, Amir
Published: (1995)

CTL for test information of digital ICs /
by: Kapur, Rohit
Published: (2003)