Cover Image

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /

Bibliographic Details
Corporate Authors: Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: New York, N.Y. : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; Available from IEEE Computer Society Publications Office, 1980.
Subjects:
Integrated circuits > Testing > Congresses.

Similar Items