| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000cam a2200000 a 4500 |
| 001 |
in00000082299 |
| 005 |
20151008061123.0 |
| 008 |
811217s1980 caua b 10110 eng |
| 010 |
|
|
|a 80083501
|
| 035 |
|
|
|a (OCoLC)07229000
|
| 035 |
|
|
|9 AAJ7350AM
|
| 039 |
0 |
|
|a 2
|b 3
|c 3
|d 3
|e 3
|
| 040 |
|
|
|a DLC
|c DLC
|d TXA
|d UtOrBLW
|
| 049 |
|
|
|a TXAM
|c 1 [1502756], 2 [1502757]
|
| 050 |
0 |
0 |
|a TK7874
|b .T45 1980
|
| 082 |
0 |
|
|a 621.381/73/0287
|2 19
|
| 111 |
2 |
|
|a Test Conference
|n (11th :
|d 1980 :
|c Philadelphia, Pa.)
|
| 245 |
1 |
0 |
|a Testing for the 80's :
|b digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /
|c sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.
|
| 264 |
|
1 |
|a New York, N.Y. :
|b Institute of Electrical and Electronics Engineers ;
|a Long Beach, Calif. :
|b Available from IEEE Computer Society Publications Office,
|c 1980.
|
| 300 |
|
|
|a xv, 507 pages :
|b illustrations ;
|c 28 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 500 |
|
|
|a Spine title: IEEE 1980 Test Conference.
|
| 500 |
|
|
|a "80CH1608-9."
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Integrated circuits
|x Testing
|v Congresses.
|
| 710 |
2 |
|
|a IEEE Computer Society.
|b Test Technology Committee.
|
| 710 |
2 |
|
|a Institute of Electrical and Electronics Engineers.
|b Philadelphia Section.
|
| 740 |
0 |
|
|a IEEE 1980 Test Conference.
|
| 999 |
|
|
|a MARS
|
| 999 |
f |
f |
|s 0901b214-ab45-3f32-b626-c1ac34d19e67
|i 4b3fa02c-fd94-3f54-9bc8-0cf748ad8d7e
|t 0
|
| 952 |
f |
f |
|p ric
|a Texas A&M University
|b Rellis Campus
|c Joint Library Facility
|s JLF
|d Remote Storage
|t 0
|e TK7874 .T45 1980
|h Library of Congress classification
|i unmediated -- volume
|m A14806252343
|
| 998 |
f |
f |
|a TK7874 .T45 1980
|t 0
|l Remote Storage
|