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Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /

Bibliographic Details
Corporate Authors: Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: New York, N.Y. : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; Available from IEEE Computer Society Publications Office, 1980.
Subjects:
Integrated circuits > Testing > Congresses.
Description
Item Description:Spine title: IEEE 1980 Test Conference.
"80CH1608-9."
Physical Description:xv, 507 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.