VLSI in the laboratory, the office, the factory, the home : digest of papers, COMPCON Spring 81, twenty-second Computer Society International Conference, Jack Tar Hotel, San Francisco, California, February 23-26 /

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

VLSI test principles and architectures : design for testability /
Published: (2006)

VLSI planarization : methods, models, implementation /
by: Feinberg, V.
Published: (1997)

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)