Advances in optical metrology : August 28-29, 1978, San Diego, California /
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
Society of Photo-Optical Instrumentation Engineers,
[1978]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 153. |
| Subjects: |
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