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Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 /

Bibliographic Details
Corporate Authors: Conference on Electronic Test and Measuring Instrumentation--Testmex Wembley, Eng., Institution of Electrical Engineers
Format: Conference Proceeding Book
Language:English
Published: London ; New York : Institution of Electrical Engineers, [1979]
Series:Conference publication (Institution of Electrical Engineers) ; no. 174.
Subjects:
Electronic instruments > Congresses.

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