Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 /
| Corporate Authors: | , |
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
London ; New York :
Institution of Electrical Engineers,
[1979]
|
| Series: | Conference publication (Institution of Electrical Engineers) ;
no. 174. |
| Subjects: |
| Item Description: | Cover and spine title: Electronic test and measuring instrumentation--Testmex 79. |
|---|---|
| Physical Description: | vii, 157 pages : illustrations ; 30 cm. |
| Bibliography: | Includes bibliographical references. |
| ISBN: | 0852962045 |