Cover Image

Technology assessment : creative futures : perspectives from and beyond the second international congress /

Bibliographic Details
Corporate Authors: International Congress on Technology Assessment University of Michigan, International Society for Technology Assessment
Other Authors: Boroush, Mark A., Chen, Kan, 1928-, Christakis, Alexander N.
Format: Conference Proceeding Book
Language:English
Published: New York : North Holland, [1980]
Series:North-Holland series in system science and engineering.
Subjects:
Technology assessment > Congresses.
Description
Physical Description:xviii, 405 pages ; 24 cm.
Bibliography:Includes bibliographies and index.
ISBN:0444003282