| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000cam a2200000 4500 |
| 001 |
in00000051894 |
| 005 |
20151007074055.0 |
| 008 |
720413s1964 nyua b 00000 eng |
| 010 |
|
|
|a 63016977
|
| 035 |
|
|
|a (OCoLC)00283713
|
| 035 |
|
|
|9 AAF0889AM
|
| 040 |
|
|
|a DLC
|c YNG
|d OCL
|d TXA
|d UtOrBLW
|
| 049 |
|
|
|a TXAM
|c [405362]
|
| 050 |
0 |
0 |
|a QC373.E4
|b S5 1964
|
| 082 |
0 |
|
|a 578.15
|
| 092 |
|
|
|a 578.15
|b S571m, 1964
|
| 100 |
1 |
|
|a Siegel, Benjamin M.
|
| 245 |
1 |
0 |
|a Modern developments in electron microscopy.
|
| 264 |
|
1 |
|a New York :
|b Academic Press,
|c 1964.
|
| 300 |
|
|
|a xiii, 432 pages :
|b illustrations, diagrams ;
|c 24 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 504 |
|
|
|a Includes bibliographical references.
|
| 650 |
|
0 |
|a Electron microscopes.
|
| 999 |
|
|
|a MARS
|
| 999 |
f |
f |
|s c6951c30-674a-36ee-9b51-db5f7c5adc34
|i de94a5af-6c50-3911-b772-aaaac7e6f77d
|t 0
|
| 952 |
f |
f |
|p ric
|a Texas A&M University
|b Rellis Campus
|c Joint Library Facility
|d Remote Storage
|t 0
|e QC373.E4 S5 1964
|h Library of Congress classification
|i unmediated -- volume
|m A14800982479
|
| 998 |
f |
f |
|a QC373.E4 S5 1964
|t 0
|l Remote Storage
|