Microelectronics and reliability.

Bibliographic Details
Previous Title:Electronics reliability & microminiaturization
Format: Journal
Language:English
Published: Oxford ; New York : Pergamon Press, [1964-]
Subjects:
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Description
Published:Vol 3, no. 1 (June 1964)-
Item Description:Title from cover.
Physical Description:volumes : illustrations ; 26-27cm.
Available also by subscription via the World Wide Web.
Publication Frequency:Monthly, <1997->
ISSN:0026-2714