Secondary ion mass spectroscopy of solid surfaces /

Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /
Published: (1986)

Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /
Published: (1979)

Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /
Published: (1984)

Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /
Published: (1986)

Ion formation from organic solids (IFOS III) : mass spectrometry of involatile material : proceedings of the third international conference, Munster, Fed. Rep. of Germany, September 16-18, 1985 /
Published: (1986)

Secondary ion mass spectrometry : an introduction to principles and practices /
by: Van der Heide, Paul, 1962-
Published: (2014)

Ion and photon emission from keV cluster impacts on surfaces /
by: Yau, Alice Yau-Lic, 1966-
Published: (1992)

Ion formation from organic solids : proceedings of the second international conference, Munster, Fed. Rep. of Germany, September 7-9, 1982 /
Published: (1983)

Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Münster, Federal Republic of Germany, September 21-23, 1987 /
Published: (1989)

Ion formation from organic solids (IFOS V) : proceedings of the fifth international conference, Lövånger, Sweden, June 18-21, 1989 /
Published: (1990)

Desorption mass spectrometry : are SIMS and FAB the same? /
Published: (1985)

New trends and potentialities of ToF-SIMS in surface studies /
by: Grams, Jacek
Published: (2007)

Desorption mass spectrometry : are SIMS and FAB the same? : developed from a symposium sponsored by 3M, the National Science Foundation Midwest Center for Mass Spectrometry at the University of Nebraska--Lincoln, and the National Science Foundation Regional Facility for Surface Analysis at the University of Minnesota, St. Paul, Minnesota, Oct. 7-10, 1984 /
Published: (1985)

Time-of-flight mass spectrometry with KeV and MeV projectiles using coincidence counting /
by: Inman, Mark Estes, 1962-
Published: (1991)

Ion spectroscopies for surface analysis /
Published: (1991)

Surface mapping based on the correlated emission of ions and electrons from hypervelocity C₆₀ impacts /
by: Eller, Michael J.
Published: (2013)

Ion formation from organic solids : proceedings of the second international conference, Münster, Fed. Rep. of Germany, September 7-9, 1982 /
Published: (1983)

Ion mobility spectrometry-mass spectrometry : theory and applications /
Published: (2011)

Initial kinetic energy of secondary ions desorbed by ²⁵²Cf fission fragments /
by: Jacobs, David Lee
Published: (1988)

Application of coincidence ion mass spectrometry for chemical and structural analysis at the sub-micron scale /
by: Balderas, Sara, 1977-
Published: (2005)

Practical aspects of trapped ion mass spectrometry.
Published: (2010)

Ion Spectroscopies for Surface Analysis /
by: Czanderna, A. W.
Published: (1991)

A Low energy nitrogen ion beam /
by: Prince, R. H.
Published: (1965)

The detection of doped Cr presence in Sr0.6Ba0.4Nb2O3 by SIMS /
by: Lee, Unchul
Published: (1999)

Secondary Ion Mass Spectrometry SIMS IV : Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983 /
by: Benninghoven, A.
Published: (1984)

Ion cyclotron resonance spectrometry /
by: Lehman, Thomas A., 1939-
Published: (1976)

Ion cyclotron resonance spectrometry /
Published: (1978)

Ion mass spectra /
by: Wilson, Robert G.
Published: (1974)

Ion cyclotron resonance spectrometry II /
Published: (1982)

Mass spectrometric analysis with cluster projectiles and coincidence counting /
by: Cox, Bedford Dwain, 1966-
Published: (1992)

Assigning structures to ions in mass spectrometry /
by: Holmes, John L. (John Leonard), 1931-
Published: (2007)

Mass spectrometry of organic ions.
by: McLafferty, Fred W.
Published: (1963)

Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center /
by: Vargas-Aburto, Carlos
Published: (1990)

Desorption induced by keV molecular and cluster projectiles /
by: Blain, Matthew Glenn, 1959-
Published: (1990)

Surface analysis of polymers by XPS and static SIMS /
by: Briggs, D. (David), 1948-
Published: (1998)

High resolution ion mobility spectrometry with increased ion transmission : exploring the analytical utility of periodic-focusing DC ion guide drift cells /
by: Blase, Ryan Christopher
Published: (2012)