| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000cam a2200000 a 4500 |
| 001 |
in00000034119 |
| 005 |
20151007055214.0 |
| 008 |
871207s1987 ne a b 00110 eng d |
| 020 |
|
|
|a 9067640786
|
| 035 |
|
|
|a (OCoLC)17196737
|
| 035 |
|
|
|9 AAB7569AM
|
| 040 |
|
|
|a PKL
|c PKL
|d GZQ
|d TXA
|d UtOrBLW
|
| 049 |
|
|
|a TXAM
|c [A11115687]
|
| 050 |
|
4 |
|a QD96.S43
|b C48 1987
|
| 100 |
1 |
|
|a Cherepin, Valentin Tikhonovich.
|
| 245 |
1 |
0 |
|a Secondary ion mass spectroscopy of solid surfaces /
|c V. Cherepin.
|
| 250 |
|
|
|a 1st English ed.
|
| 264 |
|
1 |
|a Utrecht, The Netherlands :
|b VNU Science Press,
|c 1987.
|
| 300 |
|
|
|a viii, 141 pages :
|b illustrations ;
|c 25 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 504 |
|
|
|a Includes bibliographies and index.
|
| 650 |
|
0 |
|a Secondary ion mass spectrometry.
|
| 650 |
|
0 |
|a Secondary ion emission.
|
| 999 |
|
|
|a MARS
|
| 999 |
f |
f |
|s db54114e-cfdf-3058-967a-70d5762ab1b8
|i a4f968c3-ed4a-33ba-9cb5-4974dd3a2be1
|t 0
|
| 952 |
f |
f |
|p normal
|a Texas A&M University
|b College Station
|c Sterling C. Evans Library
|d Evans: Library Stacks
|t 0
|e QD96.S43 C48 1987
|h Library of Congress classification
|i unmediated -- volume
|m A14811115687
|
| 998 |
f |
f |
|a QD96.S43 C48 1987
|t 0
|l Evans: Library Stacks
|