International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense X) : 5-8 April 1988, Orlando, Florida /

Bibliographic Details
Corporate Authors: International Conference on Thermal Infrared Sensing for Diagnostics and Control Orlando, Fla., Society of Photo-optical Instrumentation Engineers
Other Authors: Lucier, Ronald D.
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : The Society, [1988]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 934.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0934.toc

MARC

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245 1 0 |a International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense X) :  |b 5-8 April 1988, Orlando, Florida /  |c Ronald D. Lucier, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University [and others]. 
264 1 |a Bellingham, Wash., USA :  |b The Society,  |c [1988] 
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300 |a vii, 215 pages :  |b illustrations ;  |c 28 cm. 
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504 |a Includes bibliographies and index. 
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740 0 |a Thermal infrared sensing for diagnostics and control (Thermosense X). 
830 0 |a Proceedings of SPIE--the International Society for Optical Engineering ;  |v v. 934. 
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