Cover Image

Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Chen, Michael J. W., Thibadeau, Robert
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1987]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 730.
Subjects:	Engineering inspection > Automation > Congresses. Quality control > Optical methods > Congresses.

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