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| LEADER |
00000cam a2200000 a 4500 |
| 001 |
in00000031206 |
| 005 |
20151007060330.0 |
| 008 |
861126s1987 waua b 10100 eng |
| 010 |
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|a 86063732
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| 020 |
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|a 089252765X (pbk.)
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| 035 |
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|a (OCoLC)15973263
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| 035 |
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|9 AAC0595AM
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| 040 |
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|a DLC
|c DLC
|d TXA
|d UtOrBLW
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| 049 |
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|a TXAM
|c [A11683088]
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| 050 |
0 |
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|a TS156.2
|b .A89 1987
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| 082 |
0 |
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|a 681/.2
|2 19
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| 245 |
0 |
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|a Automated inspection and measurement :
|b 28-30 October 1986, Cambridge, Massachusetts /
|c Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
|
| 264 |
|
1 |
|a Bellingham, Wash., USA :
|b SPIE--the International Society for Optical Engineering,
|c [1987]
|
| 264 |
|
4 |
|c ©1987
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| 300 |
|
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|a vi, 256 pages :
|b illustrations ;
|c 28 cm.
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
|
| 337 |
|
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|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
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|a volume
|b nc
|2 rdacarrier
|
| 490 |
1 |
|
|a Proceedings of SPIE--The International Society for Optical Engineering ;
|v v. 730
|
| 504 |
|
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|a Includes bibliographies and index.
|
| 650 |
|
0 |
|a Engineering inspection
|x Automation
|v Congresses.
|
| 650 |
|
0 |
|a Quality control
|x Optical methods
|v Congresses.
|
| 700 |
1 |
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|a Chen, Michael J. W.
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| 700 |
1 |
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|a Thibadeau, Robert.
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| 710 |
2 |
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|a Society of Photo-optical Instrumentation Engineers.
|
| 830 |
|
0 |
|a Proceedings of SPIE--the International Society for Optical Engineering ;
|v v. 730.
|
| 999 |
|
|
|a MARS
|
| 999 |
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f |
|s 493a2061-90f2-31f5-a8fa-fc780582a391
|i 8396e8a6-9d5d-3349-b793-9ba231ea3a14
|t 0
|
| 952 |
f |
f |
|p ric
|a Texas A&M University
|b Rellis Campus
|c Joint Library Facility
|d Remote Storage
|t 0
|e TS156.2 .A89 1987
|h Library of Congress classification
|i unmediated -- volume
|m A14811683088
|
| 998 |
f |
f |
|a TS156.2 .A89 1987
|t 0
|l Remote Storage
|