Cover Image

Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Chen, Michael J. W., Thibadeau, Robert
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1987]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 730.
Subjects:
Engineering inspection > Automation > Congresses.
Quality control > Optical methods > Congresses.
Description
Physical Description:vi, 256 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:089252765X (pbk.)