Society of Photo-optical Instrumentation Engineers, Chen, M. J. W., & Thibadeau, R. (1987). Automated inspection and measurement: 28-30 October 1986, Cambridge, Massachusetts. SPIE--the International Society for Optical Engineering.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Michael J. W. Chen, and Robert Thibadeau. Automated Inspection and Measurement: 28-30 October 1986, Cambridge, Massachusetts. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1987.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Automated Inspection and Measurement: 28-30 October 1986, Cambridge, Massachusetts. SPIE--the International Society for Optical Engineering, 1987.
Warning: These citations may not always be 100% accurate.