Laser removal of Aluminum links for applications in wafer scale integrated circuits /

Wafer scale integration /
Published: (1989)

Fault-tolerance through reconfiguration of VLSI and WSI arrays /
by: Negrini, R.
Published: (1989)

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
by: Bahukudumbi, Sudarshan
Published: (2010)

Manufacturing yield evaluation of VLSI/WSI systems /
Published: (1995)

Digital MOS integrated circuits /
Published: (1981)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Wafer scale integration, III : proceedings of the Third IFIP WG 10.5 Workshop on Wafer Scale Integration, Como, Italy, 6-8 June 1989 /
Published: (1990)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)

Wafer-level integrated systems : implementation issues /
by: Tewksbury, Stuart K.
Published: (1989)

Diagnostic measurements in LSI/VLSI integrated circuits production /
by: Jakubowski, Andrzej
Published: (1991)

Proceedings : IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits : August 2-4, 1993, Cornell University, Ithaca, New York /
Published: (1993)

The bounding approach to VLSI circuit simulation /
by: Zukowski, Charles A.
Published: (1986)

Delay fault testing for VLSI circuits /
by: Krstić, Angela, 1965-
Published: (1998)

Advances in embedded and fan-out wafer level packaging technologies /
Published: (2019)

The design and analysis of VLSI circuits /
by: Glasser, Lance A.
Published: (1985)

Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida /
Published: (1987)

Yield simulation for integrated circuits /
by: Walker, Duncan Moore Henry
Published: (1987)

VLSI high-speed I/O circuits : theoretical basis, architecture, modeling and circuit implementation /
by: Song, Hongjiang
Published: (2009)

Motion control of a wafer stage : a design approach for speeding up IC production /
by: Roover, Dick de
Published: (1997)

VLSI Analog Circuits : Algorithms, Architecture, Modeling, and Circuit Implementation /
by: Song, Hongjiang
Published: (2016)

MOSFET models for VLSI circuit simulation : theory and practice /
by: Arora, N. (Narain), 1943-
Published: (1993)

Low-voltage CMOS VLSI circuits /
by: Kuo, James B., 1956-
Published: (1999)

Mosfet modeling for VLSI simulation : theory and practice /
by: Arora, N. (Narain), 1943-
Published: (2007)

Circuit design for CMOS VLSI /
by: Uyemura, John P. (John Paul), 1952-
Published: (1992)

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

Rapid reliability assessment of VLSICs /
Published: (1990)

VLSI test principles and architectures : design for testability /
Published: (2006)

Design methodologies for VLSI circuits /
Published: (1982)

Low-voltage SOI CMOS VLSI devices and circuits /
by: Kuo, James B., 1956-
Published: (2001)

Low-voltage SOI CMOS VLSI devices and circuits /
by: Kuo, James B., 1956-
Published: (2001)

The physics of VLSI systems /
by: Keyes, Robert W., 1921-
Published: (1987)

VLSI 93 : proceedings of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, Grenoble, France, 7-10 September, 1993 /
Published: (1994)

VLSI circuit design methodology demystified : a conceptual taxonomy /
by: Xiu, Liming
Published: (2007)

Relaxation techniques for the simulation of VLSI circuits /
by: White, Jacob K.
Published: (1987)