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International Conference on Photomechanics and Speckle Metrology : 17-20 August 1987, San Diego, California /

Bibliographic Details
Corporate Authors: International Conference on Photomechanics and Speckle Metrology San Diego, Calif., Society of Photo-optical Instrumentation Engineers, United States. Office of Naval Research, Society for Experimental Mechanics (U.S.)
Other Authors: Chiang, Fu-Pen, 1936-
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1988]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 814.
Subjects:
Speckle metrology > Congresses.
Photomechanical processes > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0814.toc

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