International Conference on Photomechanics and Speckle Metrology : 17-20 August 1987, San Diego, California /

Bibliographic Details
Corporate Authors: International Conference on Photomechanics and Speckle Metrology San Diego, Calif., Society of Photo-optical Instrumentation Engineers, United States. Office of Naval Research, Society for Experimental Mechanics (U.S.)
Other Authors: Chiang, Fu-Pen, 1936-
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1988]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 814.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0814.toc

MARC

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245 1 0 |a International Conference on Photomechanics and Speckle Metrology :  |b 17-20 August 1987, San Diego, California /  |c Fu-Pen Chiang, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Office of Naval Research, The Society for Experimental Mechanics. 
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650 0 |a Photomechanical processes  |x Congresses. 
700 1 |a Chiang, Fu-Pen,  |d 1936- 
710 2 |a Society of Photo-optical Instrumentation Engineers. 
710 1 |a United States.  |b Office of Naval Research. 
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